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Polymer Center List of Equipment
The Polymer Center is equipped with nearly every characterization tool that polymer scientists need to be on the cutting edge – electrical, chemical, and mechanical. The Center also houses high-bay synthesis and processing labs and equipment, which allows our research to be developed further along the R&D spectrum. |
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Spectroscopy
FT-NMR with full-time lab manager to provide training and maintenance
- Varian Unity 500 MHz
- Innova 300 MHz
- Innova 200 MHz (Walker undergraduate lab)
- ChemMagnetics 360 MHz – Solid State NMR, CRAMPS, PFG and high temperature (600°C) capability
- Perkin-Elmer FT-IR
UV-Vis
ESR
GC-MS Shimadzu with full MS library |
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Mw Analysis
Five GPCs with a variety of solvents and detectors
Micromass MALDI-TOF MS
Agilent LC-MS-ion trap |
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Thermal Analysis
DSC
- DuPont
- Perkin-Elmer DSC
- Perkin-Elmer DSC with UV attachment
- Mettler-Toledo DSC821e/400 with intracooler
TGA
- Perkin-Elmer
- Mettler-Toledo TGA/SDTA851e/LF/1100 with the MT5 balance
DMA
- Perkin Elmer
- Mettler-Toledo (Tritec DMA2000) – modified to a rheo-optical instrument to measure optical birefringence and dynamic mechanical properties simultaneously
- Rheometric DMTA V
Thermal Microscopy
- In-situ measurement of DSC (Mettler hot stage) and static light scattering
- Hot-stage microscope (600°C) with full screen monitor, video recorder, and freeze-frame print capability
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Mechanical Testing
Instron 4204 with 200°C and 1200°C ovens
Instron 8562 with 1500°C furnace
Multiple low-load frame mechanical testers |
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Electron Microscopy
(EM facility in MRC at RPI)
Transmission Electron Microscopy
Philips CM-12 TEM
- LaB6 Cathode
- 20, 40, 60, 80, 100, 120 kV, 2.4 Angstrom resolution
- Equipped with EDS and small CCD
JEOL JEM-2010 FASTEM
- LaB6 Cathode
- 80 to 200 kV Variable, 1.4 Angstrom resolution
- Equipped with Oxford EDS, Gatan GIF, Gatan EELS, ASID (STEM), and FASTEM
- Scanning Electron Microscopy
JEOL JSM-840 SEM
- Conventional Set-up
- .2 to 35KV 50 Angstrom resolution @ 35kV
- Equipped with Secondary, Backscattered, and EDS detectors
JEOL JSM-6332 FESEM
- Field Emission SEM
- .5 to 30kV 15 Angstrom resolution @ 15kV
- Equipped with Secondary, Backscattered and Cathode luminescence detectors
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Other Instruments
Circular dichroism
Peptide synthesizer
Contact angle measurement (Rame-hart with CCD camera and Video monitor)
Cryomicrotome
Conductivity meters for proton and electrical measurements | |
Facilities